{"title":"High mobility cadmium selenide transistors","authors":"M. Lee, S. Wright, C. P. Judge, P. Cheung","doi":"10.1109/DISPL.1991.167472","DOIUrl":null,"url":null,"abstract":"Field-effect mobilities in excess of 450 cm/sup 2/ V/sup -1/ s/sup -1/ are reported in CdSe TFTs (thin-film transistors) using a maximum process temperature of 400 degrees C. Devices with channel lengths, ranging from 5 mu m to 30 mu m with aspect ratios of 0.5 to 40 were prepared. The transfer characteristics are very steep with a gate voltage swing of approximately 15 V, giving a switching ratio of >10/sup 9/ with an off current of <10/sup -14/ A/square which is relatively insensitive to the drain voltage. Comparisons between circuit simulations using HSPICE and experimental results are shown.<<ETX>>","PeriodicalId":399708,"journal":{"name":"Conference Record of the 1991 International Display Research Conference","volume":"127 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-10-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Conference Record of the 1991 International Display Research Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DISPL.1991.167472","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6
Abstract
Field-effect mobilities in excess of 450 cm/sup 2/ V/sup -1/ s/sup -1/ are reported in CdSe TFTs (thin-film transistors) using a maximum process temperature of 400 degrees C. Devices with channel lengths, ranging from 5 mu m to 30 mu m with aspect ratios of 0.5 to 40 were prepared. The transfer characteristics are very steep with a gate voltage swing of approximately 15 V, giving a switching ratio of >10/sup 9/ with an off current of <10/sup -14/ A/square which is relatively insensitive to the drain voltage. Comparisons between circuit simulations using HSPICE and experimental results are shown.<>