High mobility cadmium selenide transistors

M. Lee, S. Wright, C. P. Judge, P. Cheung
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引用次数: 6

Abstract

Field-effect mobilities in excess of 450 cm/sup 2/ V/sup -1/ s/sup -1/ are reported in CdSe TFTs (thin-film transistors) using a maximum process temperature of 400 degrees C. Devices with channel lengths, ranging from 5 mu m to 30 mu m with aspect ratios of 0.5 to 40 were prepared. The transfer characteristics are very steep with a gate voltage swing of approximately 15 V, giving a switching ratio of >10/sup 9/ with an off current of <10/sup -14/ A/square which is relatively insensitive to the drain voltage. Comparisons between circuit simulations using HSPICE and experimental results are shown.<>
高迁移率硒化镉晶体管
据报道,在CdSe TFTs(薄膜晶体管)中,使用最高工艺温度为400℃,场效应迁移率超过450 cm/sup 2/ V/sup -1/ s/sup -1/,通道长度范围为5 μ m至30 μ m,宽高比为0.5至40。转换特性非常陡峭,栅极电压摆幅约为15 V,开关比>10/sup /,关断电流>
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