Thermomechanical Characterization of Polymer Thin Films. Application for the Conception and the Manufacturing of a 3D Interposer

L. Vignoud, Nicolas Assigbe, C. Morin, J. Dechamp, Lucile Roulet, G. Parry, R. Estevez
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Abstract

Over the past few years, polymers have appeared almost everywhere in microelectronics. Their conditions of processing and the high variability of their mechanical properties require the use of materials such as glue, passive layer, underfill etc. The mechanical behavior of polymers is characterized by viscoelasticity and so a dependence of the temperature and the frequency of loading. As a result, when we consider the mechanical properties of devices containing polymers, we need to consider the thermo-evolution of the Young modulus (E) and the CTE ($\alpha$) as their properties are not constants. For measuring the evolution of thin films thermomechanical properties, we used a metrology tool called kSAMOS ThermalScan. k-Space Associates Inc developed this thin-film metrology solution composed of an optical module producing and measuring an array of parallel laser beams, a high resolution scanning stage, a rapid thermal processing (RTP) chamber and several accessorial gas control modules. In this work we will present the measurement capabilities of this tool and the results obtained in the case of evolving materials. We will integrate the thermomechanical properties of films in our analytical model for the prediction of the stress distribution “$\text{Sigmap}\varepsilon\text{ps}$”. By means of this model, we consider the whole thermal history of the multilayer system as well as processing conditions which are taken into account for each layer. For the manufacturing of a 3D Silicon Interposer, designers need to stack integrated circuits and connect them vertically. To obtain a functional devise, stresses and strains must be controlled during all the steps of manufacturing. For example, the cutting and the thinning of the substrate increases the strain leading to possible connection problems and consequently difficulties with alignment during assemblies made at high temperatures. Coupling experimental measurements and analytical model allows us to control the bow and the stress distribution in this multi-layered structure.
聚合物薄膜的热力学特性。三维中间体概念与制造的应用
在过去的几年中,聚合物在微电子领域几乎无处不在。它们的加工条件和机械性能的高度可变性要求使用胶水、被动层、下填料等材料。聚合物的力学行为以粘弹性为特征,因此与温度和加载频率有关。因此,当我们考虑含有聚合物的器件的机械性能时,我们需要考虑杨氏模量(E)和CTE ($\alpha$)的热演化,因为它们的性能不是常数。为了测量薄膜热机械性能的演变,我们使用了一种名为kSAMOS ThermalScan的计量工具。k-Space Associates公司开发了这种薄膜计量解决方案,该解决方案由一个产生和测量平行激光束阵列的光学模块、一个高分辨率扫描平台、一个快速热处理(RTP)室和几个辅助气体控制模块组成。在这项工作中,我们将介绍该工具的测量能力以及在不断变化的材料情况下获得的结果。我们将把薄膜的热机械性能整合到我们的分析模型中,以预测应力分布“$\text{Sigmap}\varepsilon\text{ps}$”。通过该模型,我们考虑了多层体系的整个热历史以及每一层所考虑的加工条件。为了制造3D硅中间层,设计人员需要堆叠集成电路并垂直连接它们。为了得到一个功能性的设计,应力和应变必须在制造的所有步骤中得到控制。例如,基材的切割和变薄增加了应变,导致可能的连接问题,因此在高温下组装时难以对准。实验测量和分析模型的结合使我们能够控制这种多层结构的弯曲和应力分布。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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