10.3 m/spl Omega/-cm/sup 2/, 2 kV Power DMOSFETs in 4H-SiC

S. Ryu, S. Krishnaswami, M. Das, B. Hull, J. Richmond, B. Heath, A. Agarwal, J. Palmour, J. Scofield
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引用次数: 5

Abstract

High voltage power DMOSFETs in 4H-SiC are presented in this paper. A 0.5 μm long MOS gate length was used to minimize the MOS channel resistance. The DMOSFETs were able to block 2 kV with gate shorted to the source. At room temperature, a specific on-resistance of 10.3 mΩ-cm was measured with a gate bias of 12 V. The specific on-resistance was reduced to 8 mΩ-cm with 17 V on the gate. At 150 C, the specific on-resistance increased to 14 mΩ-cm with a VGS of 12 V. The increase in drift layer resistance due to a decrease in bulk electron mobility was partly cancelled out by the negative shift in MOS threshold voltage. The device showed substantially lower parasitic capacitance values compared to a typical silicon power MOSFET with a comparable blocking voltage rating, which suggest that this device can offer significant improvement in switching performance over commercially available silicon power MOSFETs.
10.3 m/spl ω /-cm/sup 2/, 2 kV功率dmosfet在4H-SiC
本文介绍了4H-SiC的高压功率dmosfet。MOS栅极长度为0.5 μm,以减小MOS沟道电阻。dmosfet能够在栅极短路到源端的情况下阻挡2kv电压。在室温下,在栅极偏压为12 V的情况下,测量到的比导通电阻为10.3 mΩ-cm。特定导通电阻降低到8 mΩ-cm,栅极上有17 V。在150℃时,比导通电阻增加到14 mΩ-cm, VGS为12 V。由于体电子迁移率的降低而引起的漂移层电阻的增加部分被MOS阈值电压的负位移所抵消。与典型的硅功率MOSFET相比,该器件具有相当低的寄生电容值,具有相当的阻断电压额定值,这表明该器件可以比市售的硅功率MOSFET提供显着改进的开关性能。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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