Embedded Test Leads to Embedded Quality

Abstract

The concept of embedded test, wherein physical test engines are built right on to the semiconductor chip, has a very strong quality value throughout the life-cycle of the chip. These embedded testers can be reused throughout the lifetime of the chip from silicon debug, to characterization, to production testing (both wafer probe and final test), to board prototyping, to system integration and then finally to the diagnosis in the field. More than 50 semiconductor and system companies worldwide are already using embedded test in their complex chips, to gain significant quality, cycle time and economic competitive advantage. This talk will explore how embedded test is becoming a standard choice for IC and system developer.