AmBRAMs - An analysis tool, method and framework for advanced measurements and reliability assessments on modern nanoscale FPGAs

Abstract

Wide portfolio of new technologies in design and manufacturing of advanced integrated circuits enabled higher integration of complex structures at ultra-high nanoscale densities, however they are subjects to sensitivity to various changes of the internal nanostructures and their parameters, resulting in the requirement of advanced measurements and complex reliability assessments. This contribution presents a new concept of a lab-on-chip and a new unique software platform.