{"title":"The effects of radiation on identical devices with different types of packaging","authors":"S. Dowling, R. H. West","doi":"10.1109/RADECS.1995.509784","DOIUrl":null,"url":null,"abstract":"NPN transistor structures taken from the same wafer of silicon have been packaged in different ways. The variation of their response to total dose has been investigated for different bias conditions.","PeriodicalId":310087,"journal":{"name":"Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems","volume":"159 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RADECS.1995.509784","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7
Abstract
NPN transistor structures taken from the same wafer of silicon have been packaged in different ways. The variation of their response to total dose has been investigated for different bias conditions.