E. Vitucci, F. Mani, V. Degli‐Esposti, Claude Oestges
{"title":"A Study on Polarimetric Properties of Scattering from Building Walls","authors":"E. Vitucci, F. Mani, V. Degli‐Esposti, Claude Oestges","doi":"10.1109/VETECF.2010.5594352","DOIUrl":null,"url":null,"abstract":"The polarimetric characteristics of the signal back scattered from a building wall are studied in this paper with the aid of MIMO measurements and Ray Tracing simulation. A very simple environment with a single rural building amid an open area is considered to reduce complexity and better isolate the different kinds of back-scattered contributions: specular reflection, diffractions, diffuse scattering. Narrowband and wideband metrics are utilized to evaluate scattering characteristics focusing in particular on its polarization properties.","PeriodicalId":417714,"journal":{"name":"2010 IEEE 72nd Vehicular Technology Conference - Fall","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-10-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 IEEE 72nd Vehicular Technology Conference - Fall","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VETECF.2010.5594352","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
The polarimetric characteristics of the signal back scattered from a building wall are studied in this paper with the aid of MIMO measurements and Ray Tracing simulation. A very simple environment with a single rural building amid an open area is considered to reduce complexity and better isolate the different kinds of back-scattered contributions: specular reflection, diffractions, diffuse scattering. Narrowband and wideband metrics are utilized to evaluate scattering characteristics focusing in particular on its polarization properties.