{"title":"An investigation on ADC testing using digital modelling","authors":"L.M. Hon, A. A'Ain","doi":"10.1109/TENCON.2004.1414915","DOIUrl":null,"url":null,"abstract":"This paper presents an analysis of test results of digital model approach on Analogue-to-digital converter (ADC). The approach is to inject primary input with arbitrary frequencies and periodical digital pulse. The output response is sampled and analysed in order to distinguish between GO or No-GO. Furthermore, the proposed technique is also coupled with power supply voltage control test technique to investigate the fault coverage margin. Histogram test, conventional industrial test technique, simulates concurrently were also employed as a comparison study.","PeriodicalId":434986,"journal":{"name":"2004 IEEE Region 10 Conference TENCON 2004.","volume":"11 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-12-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2004 IEEE Region 10 Conference TENCON 2004.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TENCON.2004.1414915","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
This paper presents an analysis of test results of digital model approach on Analogue-to-digital converter (ADC). The approach is to inject primary input with arbitrary frequencies and periodical digital pulse. The output response is sampled and analysed in order to distinguish between GO or No-GO. Furthermore, the proposed technique is also coupled with power supply voltage control test technique to investigate the fault coverage margin. Histogram test, conventional industrial test technique, simulates concurrently were also employed as a comparison study.