The Bulk Built In Current Sensor Approach for Single Event Transient Detection

Abstract

Radiation effects, particularly single event transients (SETs), are increasingly affecting the reliability of integrated circuits as device dimensions are scaling down. This paper presents the use of bulk built in current sensors (Bulk-BICS) for SET detection. The efficiency and applicability of the bulk-BICS approach for Single Event Transient detection is demonstrated through device and circuit level simulations.