Modified attenuated total reflection for the fast and routine electrooptic measurements of nonlinear optical polymer thin films

Antao Chen, V. Chuyanov, S. Garner, W. Steier, L. Dalton
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引用次数: 12

Abstract

In the course of developing EO polymers, a convenient and fast method to obtain the electrooptic (EO) coefficients, r33 and r13, is highly desirable. Some of the existing EO measurement techniques such as Fabry-Perot interferometry(1) and ellipsometry(2) require metal deposition and electrode processing for each test sample. Therefore, they are not suited for daily sample testing. Second harmonic generation (SHG) is an indirect method to measure the EO coefficients(3). It is usually performed with 1.064 Nd:YAG laser and encounters difficulties with polymers that contain high µβ chromophores because these chromophores usually have red-shifted absorption peaks that causes the Kleiman symmetry, a fundamental assumption of this technique, to break down. Attenuated total reflection (ATR) can directly measure the EO coefficients with no restriction on the wavelength of the absorption peak. One measurement scan provides the refractive index, the thickness, and an EO coefficient. Typically, the thin film electrode in contact with the test sample is made of Au or Ag in conventional ATR techniques(4). These metal thin films are soft and not durable for repeated measurements. The curve fitting algorithm for data processing(4, 5) is also inconvenient for fast sample evaluation. In this paper, a modified ATR technique for routine EO measurement is presented which does not require electrode preparation for each test sample and uses a simple algorithm for data processing.
非线性光学聚合物薄膜快速常规电光测量的修正衰减全反射
在开发EO聚合物的过程中,迫切需要一种方便快捷的方法来获得其电光系数r33和r13。现有的一些EO测量技术,如法布里-珀罗干涉法(1)和椭偏法(2),需要对每个测试样品进行金属沉积和电极处理。因此,它们不适合日常样品测试。二次谐波产生(SHG)是一种间接测量EO系数的方法(3)。它通常使用1.064 Nd:YAG激光进行,并且遇到含有高µβ发色团的聚合物的困难,因为这些发色团通常具有红移的吸收峰,导致克莱曼对称(该技术的基本假设)被破坏。衰减全反射(ATR)可以直接测量EO系数,不受吸收峰波长的限制。一次测量扫描提供折射率,厚度和EO系数。通常,在传统的ATR技术中,与测试样品接触的薄膜电极由Au或Ag制成(4)。这些金属薄膜很软,不耐用,不能重复测量。数据处理的曲线拟合算法(4,5)也不利于快速的样本评估。本文提出了一种改进的ATR技术,该技术不需要为每个测试样品制备电极,并且使用简单的算法进行数据处理。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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