Current single event effect test results for candidate spacecraft electronics

1996 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference Pub Date : 1996-07-19 DOI:10.1109/REDW.1996.574184

K. Label, A. Moran, D. Hawkins, A. Sanders, C. Seidleck, H.S. Kim, J.E. Forney, E. Stassinopoulos, P. Marshall, C. Dale, J. Kinnison, B. Carkhuff

引用次数: 19

Abstract

We present both proton and heavy ion single event effect (SEE) ground test results for candidate spacecraft electronics. A variety of digital and analog devices were tested, including EEPROMs, DRAMs, and DC-DC converters.

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候选航天器电子器件当前单事件效应试验结果

给出了候选航天器电子设备的质子和重离子单事件效应(SEE)地面测试结果。各种数字和模拟设备进行了测试，包括eeprom, dram和DC-DC转换器。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

1996 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference

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