Exploring the noise limits of fully-differential micro-watt transimpedance amplifiers for Sub-pA/yHz sensitivity

2015 11th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME) Pub Date : 2015-09-10 DOI:10.1109/PRIME.2015.7251392

Ka-Meng Lei, H. Heidari, Pui-in Mak, M. Law, F. Maloberti

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引用次数: 7

Abstract

This paper explores the noise performance limits of the differential configurations of differential transimpedance amplifiers (TIAs), which serve as a current detection front-end and converts signals for backend signal processing. TIA is one of the most frequent module adopted in biological and environmental sensing such as hall sensors and DNA synthesis detection, which require noise density down to sub-pA/√Hz with micro-watt power consumption so detailed analysis on the noise performance is required. The noises for three different TIAs, including the common-gate topology, op-amp based resistive feedback and capacitive feedback, have been investigated and simulated. Among them, op-amp based capacitive feedback, which bases on integration of input current, displays the lowest noise and best performance. Simulated in 180 nm CMOS process, the capacitive feedback technology shows an input-referred noise of 16 fA/√Hz (80 fA/√Hz) at 10 kHz (100 Hz), featuring it a promising solution for current detection.

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探索灵敏度低于pa /yHz的全差分微瓦跨阻放大器的噪声极限

本文探讨了差分跨阻放大器(TIAs)的差分配置的噪声性能限制，TIAs作为电流检测前端并为后端信号处理转换信号。TIA是生物和环境传感中最常用的模块之一，如霍尔传感器和DNA合成检测，这些传感器要求噪声密度低至sub-pA/√Hz，功耗为微瓦，因此需要对噪声性能进行详细分析。对共门拓扑、基于运放的电阻性反馈和电容性反馈三种不同TIAs的噪声进行了研究和仿真。其中基于运算放大器的电容反馈基于输入电流的集成，显示出最低的噪声和最好的性能。在180 nm CMOS工艺中模拟，电容反馈技术在10 kHz (100 Hz)下的输入参考噪声为16 fA/√Hz (80 fA/√Hz)，是一种很有前景的电流检测解决方案。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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2015 11th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME)

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