{"title":"Deep Neural Network for Device Modeling","authors":"Yuan Lei, Xiao Huo, Beiping Yan","doi":"10.1109/EDTM.2018.8421454","DOIUrl":null,"url":null,"abstract":"High quality and high accuracy device model is an essential link from device simulation to circuit simulation. However, device model using artificial neural network (ANN) often causes unphysical behaviors. A novel deep neural network (DNN) approach for device modeling is proposed in this article. A novel regression method is used to eliminate unphysical behaviors. The developed DNN model has been verified by a complete set of physical measured data with smooth and accurate predicted results.","PeriodicalId":418495,"journal":{"name":"2018 IEEE 2nd Electron Devices Technology and Manufacturing Conference (EDTM)","volume":"12 3","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"14","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE 2nd Electron Devices Technology and Manufacturing Conference (EDTM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EDTM.2018.8421454","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 14
Abstract
High quality and high accuracy device model is an essential link from device simulation to circuit simulation. However, device model using artificial neural network (ANN) often causes unphysical behaviors. A novel deep neural network (DNN) approach for device modeling is proposed in this article. A novel regression method is used to eliminate unphysical behaviors. The developed DNN model has been verified by a complete set of physical measured data with smooth and accurate predicted results.