An efficient implementation of BIST for floating point DSP processor

JaeHeung Park, Hoon Chang, Ohyoung Song
{"title":"An efficient implementation of BIST for floating point DSP processor","authors":"JaeHeung Park, Hoon Chang, Ohyoung Song","doi":"10.1109/APASIC.2000.896961","DOIUrl":null,"url":null,"abstract":"In this paper, we describe the implementation of BIST technique which is applied to enhance the reliability of the FLOVA chip i.e., the floating point DSP core for processing graphic data and 3D graphics. In order to enhance the reliability of FLOVA, we adopt the BIST technique for floating-point modules which have complicated logic. For embedded data and program memory, we adopt the memory BIST technique. The boundary scan technique, providing board-level testing and to control BIST logic, has been also implemented.","PeriodicalId":313978,"journal":{"name":"Proceedings of Second IEEE Asia Pacific Conference on ASICs. AP-ASIC 2000 (Cat. No.00EX434)","volume":"45 3","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-08-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of Second IEEE Asia Pacific Conference on ASICs. AP-ASIC 2000 (Cat. No.00EX434)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/APASIC.2000.896961","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

In this paper, we describe the implementation of BIST technique which is applied to enhance the reliability of the FLOVA chip i.e., the floating point DSP core for processing graphic data and 3D graphics. In order to enhance the reliability of FLOVA, we adopt the BIST technique for floating-point modules which have complicated logic. For embedded data and program memory, we adopt the memory BIST technique. The boundary scan technique, providing board-level testing and to control BIST logic, has been also implemented.
BIST在浮点DSP处理器上的有效实现
在本文中,我们描述了BIST技术的实现,该技术被用于提高FLOVA芯片(即处理图形数据和三维图形的浮点DSP核心)的可靠性。为了提高FLOVA的可靠性,我们对逻辑复杂的浮点模块采用了BIST技术。对于嵌入式数据和程序存储器,我们采用了存储器BIST技术。边界扫描技术,提供板级测试和控制BIST逻辑,也已实现。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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