A New Radiation Hardened by Design Latch for Ultra-Deep-Sub-Micron Technologies

Abstract

Soft errors induced by cosmic radiation have become an urgent issue for ultra-deep-sub-micron (UDSM) technologies. In this paper, we propose a new radiation hardened by design latch (RHBDL). RHBDL can improve robustness by masking the soft errors induced by SEU and SET. We evaluate the propagation delay, power dissipation and power delay product of RHBDL using SPICE simulations. Compared with existing reported solutions such as TMR-latch, RHBDL is less SEU-sensitive, more area efficient, delay and power efficient.