Soon-Kyun Shin, J. Rudell, D. Daly, C. Muñoz, D. Chang, K. Gulati, Hae-Seung Lee, M. Straayer
{"title":"A 12b 200MS/s frequency scalable zero-crossing based pipelined ADC in 55nm CMOS","authors":"Soon-Kyun Shin, J. Rudell, D. Daly, C. Muñoz, D. Chang, K. Gulati, Hae-Seung Lee, M. Straayer","doi":"10.1109/CICC.2012.6330697","DOIUrl":null,"url":null,"abstract":"A 12-bit 200MS/s zero-crossing based pipeline ADC is presented. A coarse phase followed by a level-shifted fine phase is employed for higher accuracy. To enable high frequency operation, sub-ADC flash comparators are strobed immediately after the coarse phase. The ADC occupies 0.276mm2 in 55nm CMOS and dissipates 28.5mW. 62.5dB SNDR and 78.6dBc SFDR with a 99.6MHz input signal at 200MS/s are achieved for a FOM of 131fJ/step. The reference buffer, bias circuitry, and digital error correction circuits are all implemented on chip.","PeriodicalId":130434,"journal":{"name":"Proceedings of the IEEE 2012 Custom Integrated Circuits Conference","volume":"27 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-10-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the IEEE 2012 Custom Integrated Circuits Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CICC.2012.6330697","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 11
Abstract
A 12-bit 200MS/s zero-crossing based pipeline ADC is presented. A coarse phase followed by a level-shifted fine phase is employed for higher accuracy. To enable high frequency operation, sub-ADC flash comparators are strobed immediately after the coarse phase. The ADC occupies 0.276mm2 in 55nm CMOS and dissipates 28.5mW. 62.5dB SNDR and 78.6dBc SFDR with a 99.6MHz input signal at 200MS/s are achieved for a FOM of 131fJ/step. The reference buffer, bias circuitry, and digital error correction circuits are all implemented on chip.