Comparison between ground tests and flight data for two static 32 KB memories

1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471) Pub Date : 1999-09-13 DOI:10.1109/RADECS.1999.858646

P. Cheynet, R. Valazco, R. Ecoffet, S. Duzellier, J. David, J.G. Loquet

引用次数: 9

Abstract

The microelectronics and photonics testbed (MPTB) carrying twenty-four experiments on-board a scientific satellite has been in a high radiation orbit since November 1997. This paper presents single event Upset flight results on two commercial static RAMs includes in two of the MPTB experiments.

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两种静态32kb存储器的地面试验与飞行数据比较

微电子和光子学试验台(MPTB)载于一颗科学卫星上进行24项实验，自1997年11月以来一直在高辐射轨道上运行。本文介绍了在两个MPTB实验中包含的两个商用静态RAMs的单事件扰动飞行结果。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471)

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