J. Raik, U. Reinsalu, R. Ubar, M. Jenihhin, P. Ellervee
{"title":"Code Coverage Analysis using High-Level Decision Diagrams","authors":"J. Raik, U. Reinsalu, R. Ubar, M. Jenihhin, P. Ellervee","doi":"10.1109/DDECS.2008.4538786","DOIUrl":null,"url":null,"abstract":"The paper proposes a novel method of analyzing code coverage metrics on a system representation called high-level decision diagrams (HLDD). Previous works have shown that HLDDs are an efficient model for simulation and test pattern generation. Current paper presents a technique, where fast HLDD based simulation is extended to support seamless code coverage analysis. We show how classical code coverage metrics can be directly mapped to HLDD constructs. In addition, we introduce an observability coverage calculation method using HLDD models. Experiments on ITC99 benchmark circuits indicate the feasibility of the proposed approach.","PeriodicalId":297689,"journal":{"name":"2008 11th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems","volume":"46 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-04-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"14","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 11th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DDECS.2008.4538786","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 14
Abstract
The paper proposes a novel method of analyzing code coverage metrics on a system representation called high-level decision diagrams (HLDD). Previous works have shown that HLDDs are an efficient model for simulation and test pattern generation. Current paper presents a technique, where fast HLDD based simulation is extended to support seamless code coverage analysis. We show how classical code coverage metrics can be directly mapped to HLDD constructs. In addition, we introduce an observability coverage calculation method using HLDD models. Experiments on ITC99 benchmark circuits indicate the feasibility of the proposed approach.