Robust Package Study for A Power Package by Simulation

H. Fan, Civen Li, N. Azman, Peilun Yao, Haibin Chen
{"title":"Robust Package Study for A Power Package by Simulation","authors":"H. Fan, Civen Li, N. Azman, Peilun Yao, Haibin Chen","doi":"10.1109/EuroSimE52062.2021.9410850","DOIUrl":null,"url":null,"abstract":"Delamination and solder crack are key concerns in power package, requiring significant attention by engineers during design and process development phases to ensure lowest risk as possible. At same time, more strict requirement is addressed by customer to meet high requirements for application of automotive products. Therefore, a well understanding of factors which causes delamination and solder crack is able to drive improvements on design and process optimization for more robust package. In this study, simulation models are setup considering different factor effects on delamination and solder crack, like punch tool design and lead design to reduce stress during singulation process, and molding compound materials to minimize stress on solder during thermal cycling test (TCT). Different factor effect on stress for delamination initiation during singulation process are investigated, including lead shape, punch tip shape, punch speed, and also package orientation. Overall package stress with different EMCs are also studied to minimize stress to reduce both solder crack and delamination risk. The paper demonstrated a good case of simulation driven development.","PeriodicalId":198782,"journal":{"name":"2021 22nd International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)","volume":"60 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-04-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 22nd International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EuroSimE52062.2021.9410850","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

Delamination and solder crack are key concerns in power package, requiring significant attention by engineers during design and process development phases to ensure lowest risk as possible. At same time, more strict requirement is addressed by customer to meet high requirements for application of automotive products. Therefore, a well understanding of factors which causes delamination and solder crack is able to drive improvements on design and process optimization for more robust package. In this study, simulation models are setup considering different factor effects on delamination and solder crack, like punch tool design and lead design to reduce stress during singulation process, and molding compound materials to minimize stress on solder during thermal cycling test (TCT). Different factor effect on stress for delamination initiation during singulation process are investigated, including lead shape, punch tip shape, punch speed, and also package orientation. Overall package stress with different EMCs are also studied to minimize stress to reduce both solder crack and delamination risk. The paper demonstrated a good case of simulation driven development.
基于仿真的电源封装鲁棒性研究
分层和焊料裂纹是电源封装中的关键问题,在设计和工艺开发阶段需要工程师高度关注,以确保尽可能降低风险。同时,客户提出了更严格的要求,以满足汽车产品应用的高要求。因此,充分了解导致分层和焊料裂纹的因素能够推动设计和工艺优化的改进,以获得更坚固的封装。在本研究中,建立了考虑不同因素对分层和焊料裂纹影响的仿真模型,如冲压工具设计和引线设计,以减少模拟过程中的应力,以及成型复合材料,以减少热循环测试(TCT)中焊料的应力。研究了铅芯形状、冲孔尖端形状、冲孔速度和封装方向等因素对模拟过程中分层起裂应力的影响。此外,还研究了不同EMCs下的整体封装应力,以最小化应力,从而降低焊料裂纹和分层风险。本文展示了仿真驱动开发的一个很好的案例。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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