{"title":"Strain reliability and substrate specific features of passive UHF RFID textile tag antennas","authors":"J. Virkki, T. Björninen, M. Akbari, L. Ukkonen","doi":"10.1109/ICECS.2016.7841218","DOIUrl":null,"url":null,"abstract":"We investigate the strain reliability of passive UHF RFID tags based on antennas printed on two structurally dissimilar textiles. The performance of the tags under strain and during repeated stretching cycles is evaluated through wireless measurements. Initially, both tags achieve read ranges of 9.5 meters and retain high readable ranges under notable, 20%, strain. Our results from a cyclic strain test evidence that the fabric substrate structure and elasticity play an important role in the reliability and recovery of printed thick-film conductors.","PeriodicalId":205556,"journal":{"name":"2016 IEEE International Conference on Electronics, Circuits and Systems (ICECS)","volume":"25 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE International Conference on Electronics, Circuits and Systems (ICECS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICECS.2016.7841218","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
We investigate the strain reliability of passive UHF RFID tags based on antennas printed on two structurally dissimilar textiles. The performance of the tags under strain and during repeated stretching cycles is evaluated through wireless measurements. Initially, both tags achieve read ranges of 9.5 meters and retain high readable ranges under notable, 20%, strain. Our results from a cyclic strain test evidence that the fabric substrate structure and elasticity play an important role in the reliability and recovery of printed thick-film conductors.