Testable design and testing of micro-electro-fluidic arrays

H. Kerkhoff, M. Acar
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引用次数: 47

Abstract

The testable design and testing of a fully software-controllable lab-on-a-chip, including a fluidic array of FlowFETs, control and interface electronics is presented. Test hardware is included for detecting faults in the DMOS electro-fluidic interface and the digital parts. Multidomain fault modeling and simulation shows the effects of faults in the (combined) fluidic and electrical parts. The fault simulations also reveal important parameters of multi-domain test-stimuli, e.g. fluid velocity, for detecting both electrical and fluidic defects.
微电-流控阵列的可测试设计与测试
介绍了一个完全软件可控的芯片实验室的可测试设计和测试,包括流场效应管流控阵列、控制和接口电子器件。测试硬件包括用于检测DMOS电流接口和数字部分的故障。多域故障建模与仿真显示了故障对流体和电气(组合)部件的影响。故障模拟还揭示了多域测试刺激的重要参数,例如流体速度,用于检测电气和流体缺陷。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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