The Development of Technology CdTe and CdS Layers for Thin-Film Solar Cells Creation

E. Sokol, A. Khrypunova, D. Kudii, M. Khrypunov
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Abstract

Under optimization of the cadmium telluride base layers deposited by thermal vacuum evaporation it has been established that the main defects of the structure, namely twins and stacking faults, accompany to the axial texture in CdTe facecentered cubic lattice and to the layerwise film growth. It has been shown that the optimal thickness of the “chloride treated” base layer in the thin film ITO/CdS/CdTe/Cu/Au solar cells (SC) equals 4 $\mu$m. The decreasing of CdTe film thickness leads to the SC efficiency decreasing as a result of the shunting resistance reduction, saturation diode current density and series resistance increasing. The CdTe film thickness growth leads to the SC efficiency decreasing because of the shunting resistance reduction and series resistance increasing. Experimentally approved the possibility of the deposition by close box method of the high-quality from the point of view of their structure CdTe base layers at the substrate temperatures in the range 300 - 450°C. It has been shown that for thin film glass/ITO/CdS/CdTe/Cu/Au SC optimal cadmium sulfide thickness equals 0.4 $\mu$m because of two competitive physical processes, namely, simultaneous variation of the diode saturation current density and the photocurrent density It has been experimentally demonstrated that the maximal efficiency of ITO/CdS/CdTe/Cu/Au SC corresponds to the 0,35 $\mu$m CdCl 2 thickness at “chloride treatment”. In this case both minimal series resistance and lowest diode saturation current density are achieved simultaneously
CdTe和CdS薄膜太阳能电池制备技术的发展
通过对热真空蒸发法制备的碲化镉基材层进行优化,发现其结构缺陷主要存在于CdTe面心立方晶格的轴向织构和层向薄膜生长过程中,即孪晶和层错。结果表明,在薄膜ITO/CdS/CdTe/Cu/Au太阳能电池(SC)中,“氯化物处理”的基材层的最佳厚度为4 $\mu$m。CdTe薄膜厚度的减小,由于分流电阻的减小、饱和二极管电流密度和串联电阻的增大,导致SC效率的降低。由于CdTe薄膜厚度的增加,分流电阻的减小和串联电阻的增大导致了SC效率的降低。实验结果表明,在衬底温度300 ~ 450℃范围内,采用封闭箱法制备高质量的CdTe基材层是可行的。结果表明,对于薄膜玻璃/ITO/CdS/CdTe/Cu/Au SC,由于二极管饱和电流密度和光电流密度的同时变化这两个相互竞争的物理过程,其最佳硫化镉厚度为0.4 $\mu$m。实验表明,在“氯化物处理”下,ITO/CdS/CdTe/Cu/Au SC的最大效率对应于CdCl 2厚度为0,35 $\mu$m。在这种情况下,最小的串联电阻和最低的二极管饱和电流密度同时实现
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