{"title":"The impact on electric characteristics of solar modules by its internal defects","authors":"W. Yongqing, Cai Ailing, Sun Rong-xia, Guo Yukun","doi":"10.1109/IPFA.2009.5232550","DOIUrl":null,"url":null,"abstract":"Combined with the corresponding infrared images and experimental verification, the paper analyzed impacts on the electrical property of modules caused by the internal defects aiming at the output characteristic curves measured by the Solar Simulator.","PeriodicalId":210619,"journal":{"name":"2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits","volume":"32 4","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IPFA.2009.5232550","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
Combined with the corresponding infrared images and experimental verification, the paper analyzed impacts on the electrical property of modules caused by the internal defects aiming at the output characteristic curves measured by the Solar Simulator.