{"title":"2X-Thru De-embedding for Non-2N Even Number Port Network","authors":"Bichen Chen, X. Ye, J. Fan","doi":"10.1109/ISEMC.2019.8825207","DOIUrl":null,"url":null,"abstract":"2N–port de-embedding has been well studied previously by using the higher order modal-based S-parameters. Such idea is successfully validated by using the 2X-Thru de-embedding, as well as the classic TRL. Non-2N even number (such as 6, 10, 12, etc.) port network S-parameters de-embedding is derived and validated in this paper. By inserting a factitious single-ended 2X-Thru before the fixture characterization, the derivation and validation are demonstrated through a 6-port 2X-Thru de-embedding example. After the fixture characterization, the inserted artificially single-ended 2X-Thru will be removed before the step of fixture removing calculation. As the 2X-Thru de-embedding application always has even number of port 2X-Thru fixtures, the idea in this paper extend the 2X-Thru de-embedding to any arbitrary number of port. The derivation and justification are also suitable for other de-embedding algorithms with even number of port.","PeriodicalId":137753,"journal":{"name":"2019 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI)","volume":"191 2","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-07-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.2019.8825207","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
2N–port de-embedding has been well studied previously by using the higher order modal-based S-parameters. Such idea is successfully validated by using the 2X-Thru de-embedding, as well as the classic TRL. Non-2N even number (such as 6, 10, 12, etc.) port network S-parameters de-embedding is derived and validated in this paper. By inserting a factitious single-ended 2X-Thru before the fixture characterization, the derivation and validation are demonstrated through a 6-port 2X-Thru de-embedding example. After the fixture characterization, the inserted artificially single-ended 2X-Thru will be removed before the step of fixture removing calculation. As the 2X-Thru de-embedding application always has even number of port 2X-Thru fixtures, the idea in this paper extend the 2X-Thru de-embedding to any arbitrary number of port. The derivation and justification are also suitable for other de-embedding algorithms with even number of port.