2X-Thru De-embedding for Non-2N Even Number Port Network

Bichen Chen, X. Ye, J. Fan
{"title":"2X-Thru De-embedding for Non-2N Even Number Port Network","authors":"Bichen Chen, X. Ye, J. Fan","doi":"10.1109/ISEMC.2019.8825207","DOIUrl":null,"url":null,"abstract":"2N–port de-embedding has been well studied previously by using the higher order modal-based S-parameters. Such idea is successfully validated by using the 2X-Thru de-embedding, as well as the classic TRL. Non-2N even number (such as 6, 10, 12, etc.) port network S-parameters de-embedding is derived and validated in this paper. By inserting a factitious single-ended 2X-Thru before the fixture characterization, the derivation and validation are demonstrated through a 6-port 2X-Thru de-embedding example. After the fixture characterization, the inserted artificially single-ended 2X-Thru will be removed before the step of fixture removing calculation. As the 2X-Thru de-embedding application always has even number of port 2X-Thru fixtures, the idea in this paper extend the 2X-Thru de-embedding to any arbitrary number of port. The derivation and justification are also suitable for other de-embedding algorithms with even number of port.","PeriodicalId":137753,"journal":{"name":"2019 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI)","volume":"191 2","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-07-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.2019.8825207","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

2N–port de-embedding has been well studied previously by using the higher order modal-based S-parameters. Such idea is successfully validated by using the 2X-Thru de-embedding, as well as the classic TRL. Non-2N even number (such as 6, 10, 12, etc.) port network S-parameters de-embedding is derived and validated in this paper. By inserting a factitious single-ended 2X-Thru before the fixture characterization, the derivation and validation are demonstrated through a 6-port 2X-Thru de-embedding example. After the fixture characterization, the inserted artificially single-ended 2X-Thru will be removed before the step of fixture removing calculation. As the 2X-Thru de-embedding application always has even number of port 2X-Thru fixtures, the idea in this paper extend the 2X-Thru de-embedding to any arbitrary number of port. The derivation and justification are also suitable for other de-embedding algorithms with even number of port.
非2n偶数口网络的2X-Thru反嵌入
利用基于高阶模态的s参数对2n端口去嵌入进行了较好的研究。通过使用2X-Thru去嵌入以及经典的TRL,成功验证了这种想法。本文推导并验证了非2n偶数(如6、10、12等)端口网络s参数去嵌入。通过在夹具表征之前插入一个人为的单端2X-Thru,通过一个6端口2X-Thru去嵌入示例演示了推导和验证。夹具表征完成后,插入的人工单端2X-Thru将被移除,然后进行夹具移除计算步骤。由于2X-Thru反嵌入应用总是具有偶数个端口的2X-Thru夹具,因此本文的思想将2X-Thru反嵌入扩展到任意数量的端口。推导和证明同样适用于其他偶数端口的去嵌入算法。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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