Comparison of Ultra Low Power Full Adder Cells in 22 nm FDSOI Technology

S. H. Zadeh, T. Ytterdal, S. Aunet
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引用次数: 2

Abstract

Five ultra low voltage and low power full adders have been designed and analyzed with CMOS logic structure. To compare these adders, different metrics including worst case delay, average power, PDP, and PDP*Leakage have been investigated in the supply voltage varying from 140-160 mV. All the full adders have been designed and verified with Cadence Virtuoso design in a commercially available 22 nm FDSOI technology. An extended body bias voltages introduced in a 22 nm FDSOI technology have been used to balance Pull Up/Pull Down Networks and have a high functional yield. The test bench has been used to verify the functionality of full adders automatically in different conditions of temperature and supply voltage. The simulation results show that an Xor based adder is the best of all having the lowest delay, power, PDP, and PDP*Leakage in different conditions.
超低功耗全加法器电池在22 nm FDSOI技术中的比较
采用CMOS逻辑结构设计并分析了5种超低电压低功耗全加法器。为了比较这些加法器,在140-160 mV的电源电压范围内研究了不同的指标,包括最坏情况延迟、平均功率、PDP和PDP*泄漏。所有全加法器均采用Cadence Virtuoso设计,采用商用22纳米FDSOI技术进行设计和验证。在22 nm FDSOI技术中引入的扩展体偏置电压已用于平衡Pull Up/Pull Down网络,并具有高功能良率。利用该试验台验证了全加法器在不同温度和电压条件下的自动功能。仿真结果表明,在不同条件下,基于Xor的加法器具有最低的延迟、功率、PDP和PDP*泄漏。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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