{"title":"Tunneling Attenuation and Leakage Current in MoS2 Nanoribbon MOSFETs","authors":"Ivan Prevaric, M. Matić, M. Poljak","doi":"10.23919/MIPRO57284.2023.10159745","DOIUrl":null,"url":null,"abstract":"We study the OFF-state leakage current in quasi-one-dimensional MoS2 nanoribbon (MoS2NR) FETs using ab initio Hamiltonians and quantum transport simulations based on Green’s functions. Complex band structure is computed for these devices and the energy-dependent tunneling attenuation inside the bandgap is obtained. We investigate the tunneling component of the OFF-state leakage for sub-20 nm long and sub-3 nm wide MoS2NR FETs, using the under-the-barrier (UTB) and top-of-the-barrier (ToB) ballistic models. We report that using the parabolically-approximated attenuation overestimates the OFF-state leakage significantly. Furthermore, we demonstrate that all MoS2NR FETs show good tunneling suppression due to high attenuation even for the shortest devices where the OFF-state leakage is under 16.5 nA/μm for nFETs and lower than 22 nA/μm for pFETs.","PeriodicalId":177983,"journal":{"name":"2023 46th MIPRO ICT and Electronics Convention (MIPRO)","volume":"52 18","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2023 46th MIPRO ICT and Electronics Convention (MIPRO)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/MIPRO57284.2023.10159745","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
We study the OFF-state leakage current in quasi-one-dimensional MoS2 nanoribbon (MoS2NR) FETs using ab initio Hamiltonians and quantum transport simulations based on Green’s functions. Complex band structure is computed for these devices and the energy-dependent tunneling attenuation inside the bandgap is obtained. We investigate the tunneling component of the OFF-state leakage for sub-20 nm long and sub-3 nm wide MoS2NR FETs, using the under-the-barrier (UTB) and top-of-the-barrier (ToB) ballistic models. We report that using the parabolically-approximated attenuation overestimates the OFF-state leakage significantly. Furthermore, we demonstrate that all MoS2NR FETs show good tunneling suppression due to high attenuation even for the shortest devices where the OFF-state leakage is under 16.5 nA/μm for nFETs and lower than 22 nA/μm for pFETs.