Formal Verification Aware Redundant Sequential Logic Optimization to Improve Design Utilization

Rushabh Shah, Krishna Agrawal
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Abstract

With continuous advancement in technology, semiconductor industry is moving towards lower process nodes to improve transistor density, performance, and power optimization. For lower nodes, fabrication gets costlier and area reduction is of prime importance. To align with this goal, while doing physical implementation one of the key targets is to synthesize design with most optimal logic and less redundant functional logic. Even though synthesis tools are optimized to align with customers target, there are limitations. Identification of such redundant logic is possible both in synthesis and formal verification tools. This paper presents novel algorithm and process to identify redundant logic using Formal Verification tool and use this data to generate ECO such that synthesis tool can optimize logic better than current known methods. Using proposed solution, 1K to 38K reduction in sequential cell count and 4K to 85K overall cell count reduction has been observed for various design cases. This solution provides logic area and power saving without compromising on design testability and formal verification at the cost of runtime increase.
形式验证感知冗余顺序逻辑优化提高设计利用率
随着技术的不断进步,半导体工业正朝着低工艺节点的方向发展,以提高晶体管密度、性能和功率优化。对于较低的节点,制造成本更高,减小面积是最重要的。为了与这个目标保持一致,在进行物理实现时,一个关键目标是将设计与最优逻辑和较少冗余的功能逻辑综合起来。即使合成工具经过优化以符合客户目标,也存在局限性。在综合和形式化验证工具中都可以识别这种冗余逻辑。本文提出了一种新的算法和过程,利用形式验证工具识别冗余逻辑,并利用这些数据生成ECO,使综合工具比目前已知的方法更好地优化逻辑。使用所提出的解决方案,在各种设计情况下,可以观察到顺序细胞计数减少1K到38K,总细胞计数减少4K到85K。该解决方案在不影响设计可测试性和形式验证的前提下提供了逻辑面积和功耗节省,并以增加运行时间为代价。
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