Leakage power reduction for coarse grained dynamically reconfigurable processor arrays with fine grained Power Gating technique

Yoshiki Saito, T. Shirai, Takuro Nakamura, T. Nishimura, Y. Hasegawa, S. Tsutsumi, Toshihiro Kashima, M. Nakata, S. Takeda, K. Usami, H. Amano
{"title":"Leakage power reduction for coarse grained dynamically reconfigurable processor arrays with fine grained Power Gating technique","authors":"Yoshiki Saito, T. Shirai, Takuro Nakamura, T. Nishimura, Y. Hasegawa, S. Tsutsumi, Toshihiro Kashima, M. Nakata, S. Takeda, K. Usami, H. Amano","doi":"10.1109/FPT.2008.4762410","DOIUrl":null,"url":null,"abstract":"One of the benefits of coarse grained dynamically reconfigurable processor array(DRPA) is its low dynamic power consumption by operating a number of processing elements(PE) in parallel with low clock frequency. However, in the future advanced processes, leakage power will occupy a considerable part of the total power consumption, and it may degrade the advantage of DRPAs. In order to reduce the leakage power, a fine grained Power Gating(PG) is applied to a DRPA, MuCCRA-2.32b, and leakage power and area overhead are measured. We evaluated the effect of two control modes; Pair and Unit Individual based on layout design and real applications. It appears that by applying PG for ALUs and SMUs in PEs individually, 48% of leakage power can be reduced with 9.0% of area overhead.","PeriodicalId":320925,"journal":{"name":"2008 International Conference on Field-Programmable Technology","volume":"121 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"21","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 International Conference on Field-Programmable Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/FPT.2008.4762410","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 21

Abstract

One of the benefits of coarse grained dynamically reconfigurable processor array(DRPA) is its low dynamic power consumption by operating a number of processing elements(PE) in parallel with low clock frequency. However, in the future advanced processes, leakage power will occupy a considerable part of the total power consumption, and it may degrade the advantage of DRPAs. In order to reduce the leakage power, a fine grained Power Gating(PG) is applied to a DRPA, MuCCRA-2.32b, and leakage power and area overhead are measured. We evaluated the effect of two control modes; Pair and Unit Individual based on layout design and real applications. It appears that by applying PG for ALUs and SMUs in PEs individually, 48% of leakage power can be reduced with 9.0% of area overhead.
采用细粒度功率门控技术降低粗粒度动态可重构处理器阵列的泄漏功率
粗粒度动态可重构处理器阵列(DRPA)的优点之一是通过以低时钟频率并行操作多个处理元素(PE)来降低动态功耗。然而,在未来的先进工艺中,泄漏功率将占总功耗的相当一部分,这可能会降低drpa的优势。为了降低泄漏功率,对DRPA MuCCRA-2.32b进行了细粒度功率门控(PG),测量了泄漏功率和面积开销。我们评估了两种控制模式的效果;基于布局设计和实际应用的配对和单元个体。通过对pe中的alu和smu分别应用PG,可以减少48%的泄漏功率,减少9.0%的面积开销。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信