Yoshiki Saito, T. Shirai, Takuro Nakamura, T. Nishimura, Y. Hasegawa, S. Tsutsumi, Toshihiro Kashima, M. Nakata, S. Takeda, K. Usami, H. Amano
{"title":"Leakage power reduction for coarse grained dynamically reconfigurable processor arrays with fine grained Power Gating technique","authors":"Yoshiki Saito, T. Shirai, Takuro Nakamura, T. Nishimura, Y. Hasegawa, S. Tsutsumi, Toshihiro Kashima, M. Nakata, S. Takeda, K. Usami, H. Amano","doi":"10.1109/FPT.2008.4762410","DOIUrl":null,"url":null,"abstract":"One of the benefits of coarse grained dynamically reconfigurable processor array(DRPA) is its low dynamic power consumption by operating a number of processing elements(PE) in parallel with low clock frequency. However, in the future advanced processes, leakage power will occupy a considerable part of the total power consumption, and it may degrade the advantage of DRPAs. In order to reduce the leakage power, a fine grained Power Gating(PG) is applied to a DRPA, MuCCRA-2.32b, and leakage power and area overhead are measured. We evaluated the effect of two control modes; Pair and Unit Individual based on layout design and real applications. It appears that by applying PG for ALUs and SMUs in PEs individually, 48% of leakage power can be reduced with 9.0% of area overhead.","PeriodicalId":320925,"journal":{"name":"2008 International Conference on Field-Programmable Technology","volume":"121 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"21","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 International Conference on Field-Programmable Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/FPT.2008.4762410","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 21
Abstract
One of the benefits of coarse grained dynamically reconfigurable processor array(DRPA) is its low dynamic power consumption by operating a number of processing elements(PE) in parallel with low clock frequency. However, in the future advanced processes, leakage power will occupy a considerable part of the total power consumption, and it may degrade the advantage of DRPAs. In order to reduce the leakage power, a fine grained Power Gating(PG) is applied to a DRPA, MuCCRA-2.32b, and leakage power and area overhead are measured. We evaluated the effect of two control modes; Pair and Unit Individual based on layout design and real applications. It appears that by applying PG for ALUs and SMUs in PEs individually, 48% of leakage power can be reduced with 9.0% of area overhead.