{"title":"ESD protection circuit in IC card","authors":"Chen Guping, Zhu Zhaohui","doi":"10.1109/ICSICT.1998.785934","DOIUrl":null,"url":null,"abstract":"A basic review of ESD protection mechanism is presented and a typical ESD on chip protection circuit used in IC card is discussed. Some critical factors correlated to ESD performance ore considered to form physical structure of protection device in the CMOS technology.","PeriodicalId":286980,"journal":{"name":"1998 5th International Conference on Solid-State and Integrated Circuit Technology. Proceedings (Cat. No.98EX105)","volume":"119 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-10-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1998 5th International Conference on Solid-State and Integrated Circuit Technology. Proceedings (Cat. No.98EX105)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICSICT.1998.785934","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
A basic review of ESD protection mechanism is presented and a typical ESD on chip protection circuit used in IC card is discussed. Some critical factors correlated to ESD performance ore considered to form physical structure of protection device in the CMOS technology.