Polarization-induced Strain-coupled TMD FETs (PS FETs) for Non-Volatile Memory Applications

Abstract

Among several non-volatile memories (NVMs), ferroelectric (FE) based memories show distinct advantages due to electric field ( E )-driven low-power write [1] - [2] . However, there are other concerns in FE based NVMs (such destructive read in FERAMs [3] , gate leakage in FEFETs with floating inter-layer metal (ILM) [5] and traps and depolarization fields in FEFETs without ILM [4] ). To overcome such issues while retaining the useful features of FE, we propose a Polarization-induced Strain coupled TMD FET (PS FET) [ Fig. 1(a) ] that features (a) polarization-based non-volatile bit-storage (b) E-driven write and (c) coupling of piezoelectricity with dynamic bandgap (EG) tuning of 2D Transition Metal Dichalcogenides (TMDs) for read [ Fig. 1(b) ].