Stochastic Subranging ADC Using Variable Comparator Offset Technique

Sintaro Uto, K. Ohhata
{"title":"Stochastic Subranging ADC Using Variable Comparator Offset Technique","authors":"Sintaro Uto, K. Ohhata","doi":"10.1109/RFIT49453.2020.9226236","DOIUrl":null,"url":null,"abstract":"We propose a stochastic subranging analog-to-digital converter using a variable comparator offset technique. The variable comparator offset technique enables the same comparator group to be utilized in both coarse and fine conversion phases; therefore, high resolution can be obtained with a small number of comparators. The offset current injector is added to the comparator, resulting in a variable offset. Moreover, variable offset averaging is also introduced. These techniques can change the standard deviation of the comparator group from 130 to 5 mV. The simulation results show that an average effective number of bits of 10 can be obtained when 255 × 9 comparators are used.","PeriodicalId":283714,"journal":{"name":"2020 IEEE International Symposium on Radio-Frequency Integration Technology (RFIT)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE International Symposium on Radio-Frequency Integration Technology (RFIT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RFIT49453.2020.9226236","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

We propose a stochastic subranging analog-to-digital converter using a variable comparator offset technique. The variable comparator offset technique enables the same comparator group to be utilized in both coarse and fine conversion phases; therefore, high resolution can be obtained with a small number of comparators. The offset current injector is added to the comparator, resulting in a variable offset. Moreover, variable offset averaging is also introduced. These techniques can change the standard deviation of the comparator group from 130 to 5 mV. The simulation results show that an average effective number of bits of 10 can be obtained when 255 × 9 comparators are used.
基于可变比较器偏移技术的随机子量程ADC
我们提出了一种使用可变比较器偏移技术的随机分位模数转换器。可变比较器偏移技术使同一比较器组能够在粗转换阶段和细转换阶段均被利用;因此,使用少量比较器可以获得高分辨率。将偏移电流注入器添加到比较器中,产生可变偏移。此外,还引入了可变偏移平均。这些技术可以改变比较器组的标准偏差从130到5mv。仿真结果表明,当使用255 × 9比较器时,平均有效比特数为10。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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