Solving Automotive Signal Integrity Issues by EMC Simulation

Abstract

The use of Electromagnetic (EM) simulation tools for analysing Signal Integrity (SI) performance of an automotive product is demonstrated in this paper. The contribution is demonstrated by step-by-step guidance presentation on how to handle SI simulations for a device under test (DUT) (this topic has not been addressed so frequently in the literature so far). The novelty stems from: layout improvements for Time Domain Reflectometry (TDR) issues and also by demonstrating that the use of EM simulation at the early design stage allows for the appropriate selection of resistor values to achieve optimized SI performance, without performing complex measurements.