DFT Technique for Quick Characterization of Flash Offset in Pipeline ADCs

Abstract

This paper proposes a novel DFT block and associated method for characterizing the offsets of the coarse flash used in a pipelined ADC. In non-SHA architecture, due to the presence of dynamic offset, measuring flash offsets across input frequency becomes important. By adding special data output modes, the proposed DFT technique allows speedy characterization of flash offset, across PVT, using the standard single-tone test and measurement setup for the ADCs.