Total dose bias dependency and ELDRS effects in bipolar linear devices

IEEE Radiation Effects Data Workshop Pub Date : 2002-07-15 DOI:10.1109/REDW.2002.1045543

C. Yui, S. McClure, B. Rax, J. Lehman, T. Minto, M. Wiedeman

引用次数: 14

Abstract

Total dose tests of several bipolar linear devices show sensitivity to both dose rate and bias during exposure. All devices exhibited enhanced low dose rate sensitivity (ELDRS). An accelerated ELDRS test method for three different devices demonstrates results similar to tests at low dose rate. Behavior and critical parameters from these tests are compared and discussed.

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双极线性器件的总剂量偏倚依赖性和ELDRS效应

几种双极线性装置的总剂量试验表明，在暴露期间对剂量率和偏置都很敏感。所有装置均表现出增强的低剂量率灵敏度(ELDRS)。三种不同装置的加速ELDRS试验方法显示了与低剂量率试验相似的结果。对这些试验的性能和关键参数进行了比较和讨论。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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IEEE Radiation Effects Data Workshop

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