{"title":"Power & Ground Bridging Trace Design for Improved Power Integrity","authors":"Hank Lin, B. Tseng, Jackson Yen","doi":"10.1109/ISEMC.2019.8825278","DOIUrl":null,"url":null,"abstract":"Nowadays, demand for slimmer and better performance consumer electronics increases dramatically. As PCB size keeps shrinking, power integrity issues such as high voltage drop and power loss arise due to lack of power and ground planes and broken power and ground shapes caused by densely-populated signal vias. In this paper, a novel design of power and ground bridging trace, placed between anti-pads of through-hole vias, the voltage drop issue can be greatly improved.","PeriodicalId":137753,"journal":{"name":"2019 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI)","volume":"442 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.2019.8825278","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Nowadays, demand for slimmer and better performance consumer electronics increases dramatically. As PCB size keeps shrinking, power integrity issues such as high voltage drop and power loss arise due to lack of power and ground planes and broken power and ground shapes caused by densely-populated signal vias. In this paper, a novel design of power and ground bridging trace, placed between anti-pads of through-hole vias, the voltage drop issue can be greatly improved.