Precise chip and package 3D capacitance simulations of realistic interconnects using a general purpose FEM-tool

A. Hieke
{"title":"Precise chip and package 3D capacitance simulations of realistic interconnects using a general purpose FEM-tool","authors":"A. Hieke","doi":"10.1109/EPEP.1999.819205","DOIUrl":null,"url":null,"abstract":"This paper describes on- and off-chip 3D capacitance simulations utilizing the ANSYS-Multiphysics/sup TM/ general purpose FEM system extended with an APDL macro for capacitance simulations. This facilitates the use of the advanced 3D capabilities of ANSYS/sup TM/ to generate, edit and visualize realistically shaped 3D structures.","PeriodicalId":299335,"journal":{"name":"IEEE 8th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No.99TH8412)","volume":"40 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-10-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE 8th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No.99TH8412)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEP.1999.819205","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

This paper describes on- and off-chip 3D capacitance simulations utilizing the ANSYS-Multiphysics/sup TM/ general purpose FEM system extended with an APDL macro for capacitance simulations. This facilitates the use of the advanced 3D capabilities of ANSYS/sup TM/ to generate, edit and visualize realistically shaped 3D structures.
精确的芯片和封装三维电容模拟现实的互连使用通用fem工具
本文描述了利用ANSYS-Multiphysics/sup TM/通用有限元系统扩展APDL宏进行电容仿真的片上和片外三维电容仿真。这有助于使用ANSYS/sup TM/的先进3D功能来生成,编辑和可视化逼真形状的3D结构。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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