The study of interaction of superhydrophobic (SH) materials with fluids using TSM sensors

Proceedings of the 2005 IEEE International Frequency Control Symposium and Exposition, 2005. Pub Date : 2005-08-31 DOI:10.1109/FREQ.2005.1573906

S. Kwoun, R. Cairncross, R.M. Lee, C. Brinker, P. Shah

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引用次数: 2

Abstract

Recent progress in nanotechnology has lead to development of novel materials with very unique superhydrophobic (SH) properties. In this paper, we study the thickness-shear mode (TSM) sensing technique as a potential measurement tool for characterization of SH properties of materials. The TSM sensors, coated with different SH thin films were capable to differentiate between a range of the SH properties of those films though the contact angle of those films, measured with optical techniques, have shown similar values. Also, the TSM sensors, coated with some of those SH films, exhibited almost zero attenuation and very small frequency shift when loaded with deionized water, which indicated a presence of significant slip in the mechanical interfacial boundary conditions. The observed sensitivity of the TSM technique to nanoscale-level structural features of SH films suggests that TSM sensing technology may provide more sensitive means for measurements and characterization of superhydrophobicity in comparison to the existing SH measurement techniques

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利用TSM传感器研究超疏水材料与流体的相互作用

近年来，纳米技术的进步导致了具有独特超疏水性能的新型材料的发展。在本文中，我们研究了厚度-剪切模式(TSM)传感技术作为表征材料SH性能的潜在测量工具。涂有不同SH薄膜的TSM传感器能够区分这些薄膜的一系列SH特性，尽管用光学技术测量的这些薄膜的接触角显示出相似的值。此外，涂有这些SH薄膜的TSM传感器在加载去离子水时表现出几乎为零的衰减和非常小的频移，这表明在机械界面边界条件中存在明显的滑移。TSM技术对超疏水性薄膜纳米级结构特征的敏感性表明，与现有的超疏水性测量技术相比，TSM传感技术可以为超疏水性的测量和表征提供更灵敏的手段

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Proceedings of the 2005 IEEE International Frequency Control Symposium and Exposition, 2005.

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