Development of a Flexure Mechanism for Thin Die Pick-up Process

Huaxian Wei, Tao Wu, Fupei Wu, Yuanchao Li, X. Niu
{"title":"Development of a Flexure Mechanism for Thin Die Pick-up Process","authors":"Huaxian Wei, Tao Wu, Fupei Wu, Yuanchao Li, X. Niu","doi":"10.1109/3M-NANO56083.2022.9941620","DOIUrl":null,"url":null,"abstract":"The capability of handling thin semiconductor chips during the pick-and-place process has become one of the major challenges in chip packaging process. When the chip becomes thinner, strength of the chip decreases dramatically and chip cracking increases, especially during the pick-up process. Traditional pin driving systems in the pick-up equipment that based on servo-motor and cam mechanisms are difficult to realize precise control of ejecting velocity and impact forces when peeling chips from the blue tape. The research presented in this paper aims at developing a pin driving system based on piezo-stack actuator and flexure mechanism for thin die pick-up process. First, the concept design of the piezo-driven flexure mechanism for the thin die pick-up process is established by comparison with traditional die pick-up equipment. Then, a bridge type flexure mechanism intended for the thin die pick-up process is designed and analyzed. The structure of the flexure mechanism is optimized through a parametric model using response surface method. A prototype of the mechanism is developed and tested. The experimental results are discussed. The flexure mechanism can finally achieve a displacement amplification over 9.","PeriodicalId":370631,"journal":{"name":"2022 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-08-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/3M-NANO56083.2022.9941620","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

The capability of handling thin semiconductor chips during the pick-and-place process has become one of the major challenges in chip packaging process. When the chip becomes thinner, strength of the chip decreases dramatically and chip cracking increases, especially during the pick-up process. Traditional pin driving systems in the pick-up equipment that based on servo-motor and cam mechanisms are difficult to realize precise control of ejecting velocity and impact forces when peeling chips from the blue tape. The research presented in this paper aims at developing a pin driving system based on piezo-stack actuator and flexure mechanism for thin die pick-up process. First, the concept design of the piezo-driven flexure mechanism for the thin die pick-up process is established by comparison with traditional die pick-up equipment. Then, a bridge type flexure mechanism intended for the thin die pick-up process is designed and analyzed. The structure of the flexure mechanism is optimized through a parametric model using response surface method. A prototype of the mechanism is developed and tested. The experimental results are discussed. The flexure mechanism can finally achieve a displacement amplification over 9.
薄型模具取件柔性机构的研制
薄半导体芯片在取放过程中的处理能力已成为芯片封装过程中的主要挑战之一。当切屑变薄时,切屑强度急剧下降,切屑裂纹增加,特别是在取屑过程中。传统的以伺服电机和凸轮机构为基础的取屑机销驱动系统,难以实现对蓝胶带取屑时弹射速度和冲击力的精确控制。本文研究了一种基于压电叠层作动器和柔性机构的薄型取模销驱动系统。首先,通过与传统取模设备的比较,建立了用于薄型取模工艺的压电驱动柔性机构的概念设计;然后,设计并分析了一种适用于薄型取模工艺的桥式挠性机构。采用响应面法建立了柔性机构的参数化模型,并对其结构进行了优化。研制并测试了该机构的原型。对实验结果进行了讨论。该柔性机构最终可实现9倍以上的位移放大。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信