S. Martinie, J. Lacord, O. Rozeau, M. Parihar, K. Lee, M. Bawedin, S. Cristoloveanu, Y. Taur, J. Barbe
{"title":"Z2-FET SPICE model: DC and memory operation","authors":"S. Martinie, J. Lacord, O. Rozeau, M. Parihar, K. Lee, M. Bawedin, S. Cristoloveanu, Y. Taur, J. Barbe","doi":"10.1109/S3S.2017.8309240","DOIUrl":null,"url":null,"abstract":"Z2-FET is a promising candidate for 1T-DRAM application. We report a pragmatic SPICE compact model, including DC and memory operation description. It is aligned with our TCAD simulations. The proposed model is based on V-I threshold voltage approach and it includes memorization effect. This model is implemented using Verilog-A and allows to evaluate, through SPICE simulation, the figures of merits for DC, transient and memory operation.","PeriodicalId":333587,"journal":{"name":"2017 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/S3S.2017.8309240","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
Z2-FET is a promising candidate for 1T-DRAM application. We report a pragmatic SPICE compact model, including DC and memory operation description. It is aligned with our TCAD simulations. The proposed model is based on V-I threshold voltage approach and it includes memorization effect. This model is implemented using Verilog-A and allows to evaluate, through SPICE simulation, the figures of merits for DC, transient and memory operation.