A Computationally Efficient Modelling Methodology for Field-Plates in GaN HEMTs

Jason Hodges, S. Albahrani, S. Khandelwal
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Abstract

Multiple field-plates (FP) are employed in typical GaN HEMTs for improving the device performance. In industry standard models, FP regions are modelled by adopting a full HEMT device model. As a result, a GaN HEMT device with two field plates requires the computation of equations which are the equivalent of three HEMT devices; one for the channel region, and two for the field-plate regions. This causes computational inefficiency. In this paper, we present a simplified field-plate modelling methodology which reduces the computational expense through means of approximations whilst maintaining an excellent degree of accuracy. Using insights from TCAD simulations, we develop simplifications for modelling the FP regions, improving the overall model speed. The developed methodology is validated against the TCAD data showing excellent accuracy and significant model speed improvement over the industry standard model.
氮化镓hemt场极板的高效计算建模方法
典型的GaN hemt采用多场极板(FP)来提高器件性能。在工业标准模型中,FP区域通过采用完整的HEMT器件模型来建模。因此,具有两个场极板的GaN HEMT器件需要计算相当于三个HEMT器件的方程;一个用于沟道区域,两个用于场板区域。这会导致计算效率低下。在本文中,我们提出了一种简化的场板建模方法,该方法通过近似方法减少了计算费用,同时保持了极好的精度。利用TCAD仿真的见解,我们开发了FP区域建模的简化,提高了整体建模速度。根据TCAD数据验证了所开发的方法,显示出出色的准确性和显著的模型速度优于工业标准模型。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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