{"title":"A self calibrating 12b 12µs CMOS ADC","authors":"Hae-Sung Lee, D. Hodges, P. Gray","doi":"10.1109/ISSCC.1984.1156622","DOIUrl":null,"url":null,"abstract":"Linearity errors of a weighted-capacitor ADC have been corrected, using a simple digital algorithm. A CMOS comparator which resolves 50μV in 500ns, allows this approach to yield a 12b accurate conversion in 22us. Chip area is under 7mm2.","PeriodicalId":260117,"journal":{"name":"1984 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1984 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSCC.1984.1156622","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5
Abstract
Linearity errors of a weighted-capacitor ADC have been corrected, using a simple digital algorithm. A CMOS comparator which resolves 50μV in 500ns, allows this approach to yield a 12b accurate conversion in 22us. Chip area is under 7mm2.