Error of emission measurement of ICs due to imperfect termination of TEM Cell

Abstract

Test PCB was used for generalized emission measurement on IC level using GTEM cell. Measurements result show an oscillation which is explained as an influence of imperfect absorbers of GTEM cell. The maximum error due to imperfect absorbers of emission measurement for ICs is regarded and given as a function of the reflection coefficient of absorbers (or terminations of TEM cells in general).