{"title":"Generation of Electromagnetic Fields That Have a Variable Impedance for the Testing of a Magnetic Field Sensor","authors":"M. Terrien","doi":"10.1109/ISEMC.1986.7568249","DOIUrl":null,"url":null,"abstract":"A method for electronically varying the impedance of an electromagnetic field is discussed. The theory is presented fol lowed by its application to the error testing of the HP 11940A Close-Field Probe. Applications to other forms of susceptibil ity testing are also discussed.","PeriodicalId":244612,"journal":{"name":"1986 IEEE International Symposium on Electromagnetic Compatibility","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1986-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1986 IEEE International Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.1986.7568249","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
A method for electronically varying the impedance of an electromagnetic field is discussed. The theory is presented fol lowed by its application to the error testing of the HP 11940A Close-Field Probe. Applications to other forms of susceptibil ity testing are also discussed.