{"title":"On-chip ESD protection design for HV integrated circuits","authors":"M. Ker","doi":"10.1109/INEC.2016.7589428","DOIUrl":null,"url":null,"abstract":"Electrostatic discharge (ESD) protection has been an important reliability issue to CMOS integrated circuits, especially in high-voltage (HV) applications. In this invited talk, a brief overview on ESD protection designs for HV integrated circuits is presented. The useful and safe solutions are highlighted for real applications in HV IC products.","PeriodicalId":416565,"journal":{"name":"2016 IEEE International Nanoelectronics Conference (INEC)","volume":"30 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-05-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE International Nanoelectronics Conference (INEC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/INEC.2016.7589428","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
Electrostatic discharge (ESD) protection has been an important reliability issue to CMOS integrated circuits, especially in high-voltage (HV) applications. In this invited talk, a brief overview on ESD protection designs for HV integrated circuits is presented. The useful and safe solutions are highlighted for real applications in HV IC products.