ESD Protection for Poly Fuses

Shao-Chang Huang, Li-Fan Chen, Chun-Chih Chen, Tingyou Lin, K. Hsu, Yeh-Ning Jou, Chih-Hsuan Lin, Yung-Chang Chen, Wei-Sung Chen, Jian-Hsing Lee
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引用次数: 2

Abstract

Electrostatic Discharge (ESD) can falsely program or erase the poly fuse cell even with a standard ESD protection device in parallel. In this study, special ESD protection circuits including phase change disabling circuits are successfully introduced. It is demonstrated that those can prevent the poly fuse from ESD damage by blocking ESD currents from the highly sensitive poly fuse. So, these circuits are required to allow for a protection of poly fuses despite of their extremely low ESD damage voltage of about 2–3V.
聚熔断器的ESD保护
静电放电(ESD)可以错误地编程或擦除聚熔断器,即使与标准的ESD保护装置并联。在本研究中,成功地引入了特殊的ESD保护电路,包括相变失能电路。实验证明,这些元件可以通过阻挡高灵敏度聚熔断器产生的ESD电流来防止聚熔断器的ESD损坏。因此,这些电路需要允许保护聚熔断器,尽管它们极低的ESD损坏电压约为2-3V。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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