Comparing Switching and Conduction Losses of Uni- and Bidirectional SiC Semiconductor Switches for AC Applications

D. Goldmann, Sebastian Mayer, S. Schramm, H. Herzog
{"title":"Comparing Switching and Conduction Losses of Uni- and Bidirectional SiC Semiconductor Switches for AC Applications","authors":"D. Goldmann, Sebastian Mayer, S. Schramm, H. Herzog","doi":"10.23919/epe21ecceeurope50061.2021.9570496","DOIUrl":null,"url":null,"abstract":"The presented research elaborates on the increase in conduction and switching losses when combining two regular SiC MosFETs to one bidirectional switch. The conduction losses are expected to double due to two semiconductors conducting the current while the switching losses should increase since the loop inductance is increased. Both effects are directly investigated through extensive double pulse tests and conduction loss measurements. The measured conduction losses are significantly lower than expected while no increase in switching losses can be measured. These directly measured losses are further verified through efficiency measurements with a 15 kW dc-dc converter prototype.","PeriodicalId":236701,"journal":{"name":"2021 23rd European Conference on Power Electronics and Applications (EPE'21 ECCE Europe)","volume":"8 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-09-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 23rd European Conference on Power Electronics and Applications (EPE'21 ECCE Europe)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/epe21ecceeurope50061.2021.9570496","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

The presented research elaborates on the increase in conduction and switching losses when combining two regular SiC MosFETs to one bidirectional switch. The conduction losses are expected to double due to two semiconductors conducting the current while the switching losses should increase since the loop inductance is increased. Both effects are directly investigated through extensive double pulse tests and conduction loss measurements. The measured conduction losses are significantly lower than expected while no increase in switching losses can be measured. These directly measured losses are further verified through efficiency measurements with a 15 kW dc-dc converter prototype.
比较交流应用中单向和双向SiC半导体开关的开关和传导损耗
所提出的研究详细阐述了将两个常规SiC mosfet组合到一个双向开关时导通和开关损耗的增加。由于两个半导体传导电流,导通损耗预计会增加一倍,而由于环路电感增加,开关损耗也会增加。通过广泛的双脉冲测试和传导损耗测量,直接研究了这两种效应。测量到的传导损耗明显低于预期,而开关损耗没有增加。通过15 kW dc-dc转换器原型的效率测量,进一步验证了这些直接测量的损耗。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信