Implementation of a 32-Channel Low-cost Low Current Measuring Circuit using Analog Devices ADA4530-1 on Automated Test Equipment for Parallel Leakage Current Test on Semiconductor Switch Test Platform Conversion

Abstract

Parallel measurement of leakage current in the picoampere range has been a challenge for platform conversion of semiconductor switches due to its sensitive character and test cost. As a resolution, an onboard pico-ammeter circuit based on Analog Devices ADA4530-1 is developed into a 32-channel solution for a new test platform that is constrained in terms of resource channel allocation. The 32-channel low current measuring circuit is integrated to the device interface board (DIB). This led to a more stable and accurate measurement with faster settling time, increasing the throughput potential to 60% from the previous test platform and leading to potential cost savings.