Maximum entropy mobility spectrum analysis for magnetotransport characterization of semiconductor multilayer structures

Abstract

The maximum entropy mobility spectrum analysis (ME-MSA) method has been developed on the basis of a maximum entropy (ME) principle. It allows one to calculate a smooth electrical conductivity versus mobility plot ("mobility spectrum") from the classical magnetoconductivity tensor in semiconductor multilayer structures. The advantages of the ME-MSA as compared to the MSA are demonstrated using a synthetic data set.