Dynamic study of the gate of an n-MOS microfluidic transistor for computational microfluidics

Emilio Franco, F. Perdigones, A. Luque, J. Quero
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Abstract

This paper reports for the first time the concept of maximum working frequency of the nMOS microfluidic transistor, commenting the importance of this value on the operation of the device for computational microfluidics. The main component of the microfluidic transistors is the gate, that is, the structure where the actuation takes place. For nMOS microfluidic transistors, this part is a microstructure which includes two membranes, namely, a small membrane and large membrane, linked each other by a column. The natural frequencies of the gate have to be known in order to avoid undesired behaviors. In this paper, a numerical dynamic analysis using Finite Element Method is performed in order to obtain the natural frequencies of this kind of structures, and specially the effects of those results in the whole behavior of the nMOS microfluidic transistor. The study is performed using the parameters of a fabricated microfluidic transistor, where the microstructure of the gate was correctly designed using SU-8 as material. The results show the first natural frequencies at about 4.15 kHz. This value is proposed as maximum working frequency of that particular microfluidic transistor.
用于计算微流控的n-MOS微流控晶体管栅极动力学研究
本文首次提出了nMOS微流控晶体管最大工作频率的概念,论述了该值对计算微流控器件工作的重要性。微流控晶体管的主要部件是栅极,即驱动发生的结构。对于nMOS微流控晶体管来说,这部分是一个微观结构,包括两个膜,即一个小膜和一个大膜,它们通过一个柱连接在一起。为了避免不期望的行为,必须知道门的固有频率。本文采用有限元法进行了数值动力学分析,得到了这类结构的固有频率,特别是这些频率对nMOS微流控晶体管整体性能的影响。该研究是使用预制微流控晶体管的参数进行的,其中栅极的微观结构以SU-8为材料进行了正确的设计。结果表明,第一固有频率约为4.15 kHz。这个值被认为是该特定微流体晶体管的最大工作频率。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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