Improvement of Transconductance in double channel AlGaN/GaN HEMT

Rachita Mohapatra, Pradipta Dutta
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引用次数: 2

Abstract

A double channel AlGaN/GaN HEMT is developed at 0.6 µm gate length. In the double channel HEMT, there is formation of two carrier channel due to polarisation. In this paper along with the DC I-V characteristics the improvement in transconductance , gm, at 0.1 µm gatelength are optimized. At gate length (LG) = 0.1µm, the modified structure3 has improvement in gm of 59% with respect to structure2 when drain length (LD) is increased and source length (LS) is decreased.
双通道AlGaN/GaN HEMT跨导性能的改进
开发了一个双通道AlGaN/GaN HEMT,栅极长度为0.6µm。在双通道HEMT中,由于极化形成了两个载流子通道。本文在改进直流I-V特性的同时,优化了0.1µm栅极长度下的跨导性能。在栅极长度(LG) = 0.1µm时,当漏极长度(LD)增加而源极长度(LS)减少时,改进后的结构3的gm比结构2提高了59%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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